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Signal Integrity Assessment of GNRFET-based Ternary Logic for Multi Layered GNR Interconnects with Dielectric Insertion

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dc.contributor.affiliationDA-IICT, Gandhinagar
dc.contributor.authorMekala, Girish Kumar
dc.contributor.authorMalothu, Rajeswari
dc.contributor.authorAgrawal, Yash
dc.contributor.authorChandel, R
dc.contributor.authorAgrawal, Yash
dc.contributor.authorAgrawal, Yash
dc.contributor.authorAgrawal, Yash
dc.contributor.authorAgrawal, Yash
dc.contributor.authorAgrawal, Yash
dc.date.accessioned2025-08-01T13:09:33Z
dc.date.issued22-03-2023
dc.identifier.citationGirish Kumar Mekala, Rajeswari Malothu, Agrawal, Yash, and R. Chandel, "Signal Integrity Assessment of GNRFET-based Ternary Logic for Multi Layered GNR Interconnects with Dielectric Insertion," ECS Journal of Solid State Science and Technology, IOP Publishing, ISSN: 2162-8777, 22 Mar. 2023, doi: 10.10.1149/2162-8777/acc68b.
dc.identifier.doihttps://doi.org/DOI 10.1149/2162-8777/acc68b
dc.identifier.issn2162-8777
dc.identifier.scopus2-s2.0-85152140194
dc.identifier.urihttps://ir.daiict.ac.in/handle/dau.ir/2026
dc.identifier.wosWOS:000962977200001
dc.publisherIOP Publishing
dc.relation.ispartofseriesVol. 12; No. 4
dc.source ECS Journal of Solid State Science and Technology
dc.source.urihttps://iopscience.iop.org/article/10.1149/2162-8777/acc68b
dc.titleSignal Integrity Assessment of GNRFET-based Ternary Logic for Multi Layered GNR Interconnects with Dielectric Insertion
dspace.entity.typePublication
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relation.isAuthorOfPublication.latestForDiscovery3cc1160e-2d03-49ec-842b-cc76c6d35776

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