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Variability Analysis of Stochastic Parameters on the Electrical Performance of On-Chip Current-Mode Interconnect System

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dc.contributor.affiliationDA-IICT, Gandhinagar
dc.contributor.authorAgrawal, Yash
dc.contributor.authorChandel, Rajeevan
dc.contributor.authorDhiman, Rohit
dc.contributor.authorAgrawal, Yash
dc.contributor.authorAgrawal, Yash
dc.contributor.authorAgrawal, Yash
dc.contributor.authorAgrawal, Yash
dc.contributor.authorAgrawal, Yash
dc.date.accessioned2025-08-01T13:09:32Z
dc.date.issued01-03-2017
dc.format.extent268-280
dc.identifier.citationAgrawal, Yash, Rajeevan Chandel, and Rohit Dhiman, "Variability Analysis of Stochastic Parameters on the Electrical Performance of On-Chip Current-Mode Interconnect System," IETE Journal of Research, vol. 63, no. 2, pp. 268-280, Mar. 2017. doi: 10.1080/03772063.2016.1257374
dc.identifier.doihttps://doi.org/10.1080/03772063.2016.1257374
dc.identifier.issn0974-780X
dc.identifier.scopus2-s2.0-85006857175
dc.identifier.urihttps://ir.daiict.ac.in/handle/dau.ir/2019
dc.identifier.wosWOS:000399564000014
dc.publisherTaylor & Francis
dc.relation.ispartofseriesVol. 63; No. 2
dc.sourceIETE Journal of Research
dc.source.urihttps://www.tandfonline.com/doi/abs/10.1080/03772063.2016.1257374
dc.titleVariability Analysis of Stochastic Parameters on the Electrical Performance of On-Chip Current-Mode Interconnect System
dspace.entity.typePublication
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relation.isAuthorOfPublication.latestForDiscovery3cc1160e-2d03-49ec-842b-cc76c6d35776

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