Publication: Variability Analysis of Stochastic Parameters on the Electrical Performance of On-Chip Current-Mode Interconnect System
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Taylor & Francis
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Agrawal, Yash, Rajeevan Chandel, and Rohit Dhiman, "Variability Analysis of Stochastic Parameters on the Electrical Performance of On-Chip Current-Mode Interconnect System," IETE Journal of Research, vol. 63, no. 2, pp. 268-280, Mar. 2017. doi: 10.1080/03772063.2016.1257374