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https://ir.daiict.ac.in/handle/123456789/37
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search.filters.author.Kapoor, Kalpesh
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search.filters.author.Bowen, Jonathan P
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A formal analysis of MCDC and RCDC test criteria
(
Wiley
,
01-03-2005
)
Kapoor, Kalpesh
;
Bowen, Jonathan P
;
Kapoor, Kalpesh
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Formal analysis of coupling hypothesis for logical faults
(
Springer
,
01-07-2006
)
Kapoor, Kalpesh
;
Kapoor, Kalpesh
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Test conditions for fault classes in Boolean specifications
(
ACM
,
01-07-2007
)
Kapoor, Kalpesh
;
Bowen, Jonathan P
;
Kapoor, Kalpesh
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