M Tech Dissertations
Permanent URI for this collectionhttp://ir.daiict.ac.in/handle/123456789/3
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Item Open Access Transaction based verification of discrete wavelet transform IP core using wishbone transactor(Dhirubhai Ambani Institute of Information and Communication Technology, 2010) Patel, Birenkumar; Dubey, RahulVerification is major concern in product development life cycle. The number of human hours required writing a test bench and choice of verification approach is the major contributor in the Non Recurring Engineering (NRE) cost. There are too many techniques for verification. Register Transfer level (RTL) verification is too slow. Transaction based verification technique is used for faster verification of any Intellectual Property core. Transaction-based verification allows simulation and debug at the transaction level, in addition to signal or pin level. All possible transaction types between different modules in a system are created and systematically tested. It does not require detailed test benches with large vector. Device under test (DUT) operates at a binary stimulus level(e.g. Zeros and Ones). Test bench includes one model to define the transactions at a high level (e.g. READ) and another model to interpret transaction and translates them into the binary level. DUT is implemented in lower abstraction language like Verilog and test bench is created in higher abstraction language like C++. The Discrete Wavelet Transform’s (DWT) Intellectual Property (IP) core is used as a DUT. DWT is implemented by Lifting scheme based Daubechies 9/7 filter. Lifting scheme has an advantage over conventional convolution method like time complexity of operation. Wishbone transactor is designed for verification of IP core. Whole system is verified on ZeBu emulator. The same Wishbone transactor is used for verification of different Wishbone compatible IP core.Item Open Access Test methodology for prediction of analog performance parameters(Dhirubhai Ambani Institute of Information and Communication Technology, 2010) Akula, Sandeep; Nagchoudhuri, DipankarAnalog testing, the name itself signifies the detection of faults in analog circuits. The aim of this thesis is to increase the test effectiveness and work in the performance parameter space. There are many test methodologies which can detect the faults in the circuit under test (CUT), out of which the test methodologies which can determine CUT performance parameters resulting in enhanced test effectiveness are, predictive oscillation based test methodologies. To detect the catastrophic and parametric faults these methodologies are used. These test methodologies are preferred over other methodologies because the input test stimulus generation is not needed, which reduces the complexity if multiple inputs are applied to the circuit. These test techniques are implemented with prediction process using neural networks which will in turn increases the performance of the circuit under test. The thesis follows with the implementation of the techniques and understanding the methods to increase the test effectiveness. The design process is performed in CADENCE simulation tool with 180nm technology.Item Open Access Design of low-voltage, low-power, wide-band CMOS LC VCO using active inductors(Dhirubhai Ambani Institute of Information and Communication Technology, 2008) Sesha Sai, Aduru Venkata Raghava; Parikh, Chetan D.In this thesis the design of low-voltage, low-power, wide-band CMOS LC VCO using active inductor has been proposed. The oscillator is based upon the classic LC-tuned negative-resistance topology, with a novel active inductor using a low-voltage gyrator topology with a feedback resistance, where feedback resistance is realized by a NMOS operating in triode region whose bias voltage tunes the inductance of the active inductor and hence the frequency of VCO. The simulation results shows that this VCO operates in a 1.19 GHz to 2.49 GHz , while consuming 1.09 mW from a 1.2V power supply. The VCO’s phase noise level is -86.9 dBc/Hz at 1 MHz offset from a 1.55 GHz carrier. The deviation of the phase noise is 11.5 dBc/Hz during this tuning range. All the circuit simulations of VCO were simulated in SpectreRF using TSMC 0.18μm CMOS technology.Item Open Access Design of low voltage high performance voltage controlled oscillator(Dhirubhai Ambani Institute of Information and Communication Technology, 2008) Ramesh, R; Nagchoudhuri, Dipankar; Mandal, Sushanta KumarIn this thesis an ultra low voltage differential capacitive feedback VCO is being proposed .The VCO operates at very low supply voltage of 0.6V.The VCO uses techniques like Forward Body Bias (FBB), and capacitive feedback to achieve high performance in terms of phase noise and output voltage swing. It uses differential MOS varactors for frequency tuning due to which all low frequency noise such as flicker noise gets rejected. Inductor was designed and it was simulated in IE3D electromagnetic simulator to achieve good Quality factor. This VCO achieves a very low phase noise of -119dBc/Hz@1-MHz offset frequency, power consumption of 3.27mW, and tuning range of 6% .All the circuit simulations of VCO were simulated in SpectreRF using TSMC 0.18μm CMOS technology