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  4. Efficient Dynamic Mesh Refinement Technique for Simulation of HPM Breakdown-Induced Plasma Pattern Formation

Publication:
Efficient Dynamic Mesh Refinement Technique for Simulation of HPM Breakdown-Induced Plasma Pattern Formation

Date

01-01-2023

Authors

Ghosh, Pratik
Chaudhury, BhaskarORCID 0000-0001-7618-3737

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IEEE

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Abstract

Numerical simulation of the complex plasma dynamics associated with high power, high-frequency microwave breakdown at high pressures, leading to the formation of filamentary plasma structures such as self-organized plasma arrays, is a computationally challenging problem. The widely used 2-D electromagnetic (EM)�plasma fluid model, which accurately captures the experimental observations, requires a runtime of several days to months to simulate standard problems due to stringent numerical requirements in terms of cell size and time step. This article presents a self-aware mesh refinement (MR) algorithm that uses a coarse mesh and a fine mesh that dynamically expand based on the plasma profile topology to resolve the sharp gradients in the�E�-fields and plasma density in the breakdown region. The dynamic MR (DMR) technique is explained in detail, and its performance has been evaluated using a standard benchmark microwave breakdown problem. We observe a speedup of 8 (of the order of�O(r3)�, when the refinement factor (�r�) is 2) compared with a traditional single uniform fine-mesh-based simulation. The technique is scalable and performs better when the problem size increases. We also present a comprehensive spatio-temporal visual analysis to explain the complex physics of high-power microwave (HPM) breakdown, leading to self-organized plasma filaments as an application of the DMR technique.

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Ghosh, Pratik, and Chaudhury, Bhaskar, "Efficient Dynamic Mesh Refinement Technique for Simulation of HPM Breakdown-Induced Plasma Pattern Formation," IEEE Transactions on Plasma Science, IEEE, ISSN: 1939-9375, vol. 51, no. 1, Jan. 2023, pp. 66-76, doi: 10.1109/TPS.2022.3226251.

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https://ir.daiict.ac.in/handle/dau.ir/2065

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