Publication:
Formal analysis of coupling hypothesis for logical faults

dc.contributor.affiliationDA-IICT, Gandhinagar
dc.contributor.authorKapoor, Kalpesh
dc.date.accessioned2025-08-01T13:09:03Z
dc.date.issued01-07-2006
dc.description.abstractFault-based testing focuses on detecting faults in a software. Test data is typically generated considering the presence of a single fault at a time, under the assumption of coupling hypothesis. Fault-based testing approach, in particular mutation testing, assumes that the coupling hypothesis holds. According to the hypothesis, a test set that can detect presence of single faults in an implementation, is also likely to detect presence of multiple faults. In this paper it is formally shown that the hypothesis is guaranteed to hold for a large number of logical fault classes.
dc.format.extent80-87
dc.identifier.citationKapoor, Kalpesh. "Formal analysis of coupling hypothesis for logical faults," Innovations in Systems and Software Engineering, vol. 2, no. 02, pp. 80-87, Jul. 2006.
dc.identifier.doi10.1007/s11334-006-0002-z
dc.identifier.issn1614-5054
dc.identifier.scopus2-s2.0-33746804079
dc.identifier.urihttps://ir.daiict.ac.in/handle/dau.ir/1586
dc.language.isoen
dc.publisherSpringer
dc.relation.ispartofseriesVol. 2; No.
dc.sourceInnovations in Systems and Software Engineering
dc.source.urihttps://link.springer.com/article/10.1007/s11334-006-0002-z
dc.titleFormal analysis of coupling hypothesis for logical faults
dspace.entity.typePublication
relation.isAuthorOfPublication2a473f3e-12f9-48cb-af51-e1bce2b18c0d
relation.isAuthorOfPublication.latestForDiscovery2a473f3e-12f9-48cb-af51-e1bce2b18c0d

Files

Collections