Person: Kapoor, Kalpesh
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Kalpesh Kapoor
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Publication Metadata only A formal analysis of MCDC and RCDC test criteria(Wiley, 01-03-2005) Kapoor, Kalpesh; Bowen, Jonathan P; DA-IICT, GandhinagarThe Modified Condition Decision Coverage (MCDC) test criterion is a mandatory requirement for the testing of avionics software as per the DO-178B standard. This paper presents a formal analysis for the three different forms of MCDC. In addition, a recently proposed test criterion, Reinforced Condition Decision Coverage (RCDC), has also been investigated in comparison with MCDC. In contrast with the earlier analysis approaches that have been based on empirical and probabilistic models, the principles of Boolean ogic are used here to study the fault detection effectiveness of the MCDC and RCDC criteria. Based on the properties of Boolean specifications, the analysis identifies the detection conditions for six kinds of faults. The results allow the measurement of the effort required in testing and the effectiveness of generated test sets satisfying the MCDC and RCDC criteria. Copyright � 2004 John Wiley & Sons, Ltd.Publication Metadata only Test conditions for fault classes in Boolean specifications(ACM, 01-07-2007) Kapoor, Kalpesh; Bowen, Jonathan P; DA-IICT, GandhinagarFault-based testing of software checks the software implementation for a set of faults. Two previous papers on fault-based testing [Kuhn 1999; Tsuchiya and Kikuno 2002] represent the required behavior of the software as a Boolean specification represented in Disjunctive Normal Form (DNF) and then show that faults may be organized in a hierarchy. This article extends these results by identifying necessary and sufficient conditions for fault-based testing. Unlike previous solutions, the formal analysis used to derive these conditions imposes no restrictions (such as DNF) on the form of the Boolean specification.Publication Metadata only Formal analysis of coupling hypothesis for logical faults(Springer, 01-07-2006) Kapoor, Kalpesh; DA-IICT, GandhinagarFault-based testing focuses on detecting faults in a software. Test data is typically generated considering the presence of a single fault at a time, under the assumption of coupling hypothesis. Fault-based testing approach, in particular mutation testing, assumes that the coupling hypothesis holds. According to the hypothesis, a test set that can detect presence of single faults in an implementation, is also likely to detect presence of multiple faults. In this paper it is formally shown that the hypothesis is guaranteed to hold for a large number of logical fault classes.